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QT-6000 Discrete Device High-Speed Test System

QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.



Suspended power supply

Four quadrant circuit

High speed test

Supports multiple extensions

Type
QT-6000
Advantages ? QT-6000 discrete device high-speed testing machine has the performance advantages of high testing accuracy, fast testing speed, good stability, high reliability and strong anti-interference ability.
? Adopting four-quadrant circuit, the device under test can be protected very well.
? Adopting suspended power supply and fully symmetrical structure.
? High-speed testing meets the requirements of handler above UPH56K.
Main Features ? High speed test, UPH>40K
? One-to-two can achieve 100% FT+QA parallel testing
? Advanced capacitor high-speed test solution to achieve CAP+DC same-station testing
? Built-in UIS test solution to achieve DC+UIS same-station testing

? LCR precision capacitance test, the minimum test capacitance value is 100fF

Voltage/current (optional): 1200V/600V, 30A/ 10A/3A.







Testing standards



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